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Excellence in Product Quality
At SOODE (JOHOR) SDN BHD, we are committed to delivering products and services that exceed our customers’ expectations. Quality control is at the heart of everything we do, ensuring that each step of our process is meticulously monitored and refined to maintain the highest standards.
| Equipment | Maker | Model | Capacity (Range) | Resolution / Step | Accuracy (MU) |
|---|---|---|---|---|---|
| CMM | Mitutoyo | BEYOND CRYSTA C544 | X : 500mm | 0.0001mm | MPE.E=(1.9+3L/1000)/ (1.7+3L/1000)(µm) |
| Y : 400mm | MPE.P=1.9/1.7(µm) | ||||
| Z : 400mm | – | ||||
| CMM | Acccretech (Tokyo Seimitsu) | XYZAX AXCEL | X : 900mm | 0.0002mm | MPE E0 (µm) = 1.8 + 4L/1000 |
| Y : 1000mm | (L in mm) | ||||
| Z : 600mm | – | ||||
| Profile Projector | Mitutoyo | PV-500 | X : 200mm | 0.001mm | X,Y : (3 + L/10) µm |
| Y : 100mm | |||||
| Surface Roughness Tester | Mitutoyo | SV-402 | X-Axis : 50mm | Z1 (Detector) : 0.1/0.01/0.001um | NA |
| Z1 (Detector) : 600/80/8um | |||||
| Roundtest | Mitutoyo | RA-2000 | X : 175mm | 0.0001mm | Radial – (0.02+6H/10000) μm [(0.8+0.6H) μinch], H= Probing height (mm [inch]) Axial – (0.02+6R/10000) μm [(0.8+0.6R) μinch], R= Probing radius (mm [inch]) |
| Y : 280mm | |||||
| Tool Measuring Microscopes | Mitutoyo | MF-1020T | X : 200mm | 0.001mm | (µm) |
| Y : 100mm | 3+0.02L | ||||
| Hardness Tester | Mitutoyo | HR-511 810-208E | 15, 30, 45, 60, 100, 150 kgf | 0.1RCK | NA |
| 0.1SRCK | |||||
| Hardness Tester | Mitutoyo | HM-113 810-969E | 10 ~ 1000 gf | 0.1HV | NA |
| Contour Measuring Instrument | Acccretech (Tokyo Seimitsu) | Surfcom Nex 030 DX | Z-axis (mm): 60mm | 0.1 µm | X : ±(1.0 +1L/100) µm |
| Z : ±(1.5 + 2H/100) µm | |||||
| Countourecord | Acccretech (Tokyo Seimitsu) | Surfcom 1700DX | Z : 50mm | 0.1 µm | X : ± (1.0+1L/100) |
| X : 100mm | Z : ± (1.8+|2H|/100) | ||||
| Roughness Tester | Acccretech (Tokyo Seimitsu) | Surfcom 1400D | X : 100mm/0.1μm or 32,000 points | 0.001 | ±5 % |
| CNC Video Measuring System NEXIV | Nikon | iNEXIV VMA-6555 | X : 650mm | 0.0001 | X : ±0.40um |
| Y : 550mm | Y : ±0.50um | ||||
| Z : 200mm | Z : ±1.0um | ||||
| Profile Projector | Nikon | V-24B | X : 200mm | 0.001 | ±0.05% for contour illumination ±0.075% for surface illumination |
| Y : 80mm | |||||
| Profile Projector | Nikon | V-20B | X : 150mm | 0.001 | 0.004 mm |
| Y : 100mm | |||||
| Tool Measuring Microscopes | Nikon | MM-40 | X : 120mm | 0.001mm | 0.007 mm |
| Y : 80mm | |||||
| IM-Vision | Keyence | IM-6120 | Z : 30mm | NA | Wide-field – W/o binding: ±5 μm With binding: ±(7 + 0.02 L) μm High-precision – W/o binding: ±2 μm With binding: ±(4 + 0.02 L) μm |
| X : 100mm Y :200mm | |||||
| JISC Loadcell | JISC | JLC-M1kN | 0-1000/0.1N | 1000 | ±0.50 % |
| Liquid Particle Spectrometer | PMS | CLS700(T)/Liquilazs05 (0.5 micron) | 0.5um ~ 20.0um | NA | Greater than 90% accuracy of 10,000 particles/ml |
| Smartscope | OGP inc. | 250CFOX | X : 300mm | 0.0001 | X,Y : E2=(3.0+L/75)(µm) |
| Y : 150mm | Z : E1=(5.0+L/150)(µm) | ||||
| Z : 150mm | – | ||||
| Coating Thickness Gauge | Fischer | DUALSCOPE MP0 | 11.7 ~ 995.5 µm | 0.01 / 0.1 µm | ±0.3 µm |
| Equipment | Maker | Model | Capacity (Range) | Resolution / Step | Accuracy (MU) |
|---|---|---|---|---|---|
| CMM | Mitutoyo | BEYOND CRYSTA C544 | X : 500mm | 0.0001mm | MPE.E=(1.9+3L/1000)/ (1.7+3L/1000)(µm) |
| Y : 400mm | MPE.P=1.9/1.7(µm) | ||||
| Z : 400mm | |||||
| CMM | Acccretech (Tokyo Seimitsu) | XYZAX AXCEL | X : 900mm | 0.0002mm | MPE E0 (µm) = 1.8 + 4L/1000 |
| Y : 1000mm | (L in mm) | ||||
| Z : 600mm | |||||
| Profile Projector | Mitutoyo | PV-500 | X : 200mm | 0.001mm | X,Y : (3 + L/10) µm |
| Y : 100mm | |||||
| Surface Roughness Tester | Mitutoyo | SV-402 | X-Axis : 50mm | Z1 (Detector) : 0.1/0.01/0.001um | NA |
| Z1 (Detector) : 600/80/8um | |||||
| Roundtest | Mitutoyo | RA-2000 | X : 175mm | 0.0001mm | NA |
| Y : 280mm | |||||
| Tool Measuring Microscopes | Mitutoyo | MF-1020T | X : 200mm | 0.001mm | (µm) |
| Y : 100mm | 3+0.02L | ||||
| Hardness Tester | Mitutoyo | HR-511 810-208E | 15, 30, 45, 60, 100, 150 kgf | 0.1RCK | NA |
| 0.1SRCK | |||||
| Hardness Tester | Mitutoyo | HM-113 810-969E | 10 ~ 1000 gf | 0.1HV | NA |
| Contour Measuring Instrument | Acccretech (Tokyo Seimitsu) | Surfcom Nex 030 DX | Z-axis (mm): 60mm | 0.1 µm | X : ±(1.0 +1L/100) µm |
| Z : ±(1.5 + 2H/100) µm | |||||
| Countourecord | Acccretech (Tokyo Seimitsu) | Surfcom 1700DX | Z : 50mm | 0.1 µm | X : ± (1.0+1L/100) |
| X : 100mm | Z : ± (1.8+|2H|/100) | ||||
| Roughness Tester | Acccretech (Tokyo Seimitsu) | Surfcom 1400D | X : 100mm/0.1μm or 32,000 points | 0.001 | ±5 % |
| CNC Video Measuring System NEXIV | Nikon | iNEXIV VMA-6555 | X : 650mm | 0.0001 | X : ±0.40um |
| Y : 550mm | Y : ±0.50um | ||||
| Z : 200mm | Z : ±1.0um | ||||
| Profile Projector | Nikon | V-24B | X : 200mm | 0.001 | 0.004 mm |
| Y : 80mm | |||||
| Profile Projector | Nikon | V-20B | X : 150mm | 0.001 | 0.004 mm |
| Y : 100mm | |||||
| Tool Measuring Microscopes | Nikon | MM-40 | X : 120mm | 0.001mm | 0.007 mm |
| Y : 80mm | |||||
| IM-Vision | Keyence | IM-6120 | Z : 30mm | NA | NA |
| X : 100mm Y :200mm | |||||
| JISC Loadcell | JISC | JLC-M1kN | 0-1000/0.1N | 1000 | ±0.50 % |
| Liquid Particle Spectrometer | PMS | CLS700(T)/Liquilazs05 (0.5 micron) | 0.5um ~ 20.0um | NA | NA |
| Smartscope | OGP inc. | 250CFOX | X : 300mm | 0.0001 | X,Y : E2=(3.0+L/75)(µm) |
| Y : 150mm | Z : E1=(5.0+L/150)(µm) | ||||
| Z : 150mm | |||||
| Coating Thickness Gauge | Fischer | DUALSCOPE MP0 | 11.7 ~ 995.5 µm | 0.01 / 0.1 µm | ±0.3 µm |