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Measurement Equipment

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Excellence in Product Quality

At SOODE (JOHOR) SDN. BHD., we are committed to delivering products and services that exceed our customers’ expectations. Quality control is at the heart of everything we do, ensuring that each step of our process is meticulously monitored and refined to maintain the highest standards.

 
Equipment Maker Model Capacity (Range) Resolution / Step Accuracy (MU)
CMM Mitutoyo BEYOND CRYSTA C544 X : 500mm 0.0001mm MPE.E=(1.9+3L/1000)/ (1.7+3L/1000)(µm)
Y : 400mm MPE.P=1.9/1.7(µm)
Z : 400mm –
CMM Acccretech (Tokyo Seimitsu) XYZAX AXCEL X : 900mm 0.0002mm MPE E0 (µm) = 1.8 + 4L/1000
Y : 1000mm (L in mm)
Z : 600mm –
Profile Projector Mitutoyo PV-500 X : 200mm 0.001mm X,Y : (3 + L/10) µm
Y : 100mm
Surface Roughness Tester Mitutoyo SV-402 X-Axis : 50mm Z1 (Detector) : 0.1/0.01/0.001um NA
Z1 (Detector) : 600/80/8um
Roundtest Mitutoyo RA-2000 X : 175mm 0.0001mm Radial – (0.02+6H/10000) μm [(0.8+0.6H) μinch], H= Probing height (mm [inch]) Axial – (0.02+6R/10000) μm [(0.8+0.6R) μinch], R= Probing radius (mm [inch])
Y : 280mm
Tool Measuring Microscopes Mitutoyo MF-1020T X : 200mm 0.001mm (µm)
Y : 100mm 3+0.02L
Hardness Tester Mitutoyo HR-511 810-208E 15, 30, 45, 60, 100, 150 kgf 0.1RCK NA
0.1SRCK
Hardness Tester Mitutoyo HM-113 810-969E 10 ~ 1000 gf 0.1HV NA
Contour Measuring Instrument Acccretech (Tokyo Seimitsu) Surfcom Nex 030 DX Z-axis (mm): 60mm 0.1 µm X : ±(1.0 +1L/100) µm
Z : ±(1.5 + 2H/100) µm
Countourecord Acccretech (Tokyo Seimitsu) Surfcom 1700DX Z : 50mm 0.1 µm X : ± (1.0+1L/100)
X : 100mm Z : ± (1.8+|2H|/100)
Roughness Tester Acccretech (Tokyo Seimitsu) Surfcom 1400D X : 100mm/0.1μm or 32,000 points 0.001 ±5 %
CNC Video Measuring System NEXIV Nikon iNEXIV VMA-6555 X : 650mm 0.0001 X : ±0.40um
Y : 550mm Y : ±0.50um
Z : 200mm Z : ±1.0um
Profile Projector Nikon V-24B X : 200mm 0.001 ±0.05% for contour illumination ±0.075% for surface illumination
Y : 80mm
Profile Projector Nikon V-20B X : 150mm 0.001 0.004 mm
Y : 100mm
Tool Measuring Microscopes Nikon MM-40 X : 120mm 0.001mm 0.007 mm
Y : 80mm
Multisensor Measurement System Keyence LM-X100L Z : 75mm Wide Field Mode : ±0.5µm; High Accuracy Mode : ±0.1µm Wide Field Mode – Without binding: ±2µm With binding: ±(1.8 + 0.02L)µm; High Accuracy Mode – Without binding: ±0.7µm With binding: ±(2.8 + 0.02L)µm
X : 325mm Y :175mm
JISC Loadcell JISC JLC-M1kN 0-1000/0.1N 1000 ±0.50 %
Liquid Particle Spectrometer PMS CLS700(T)/Liquilazs05 (0.5 micron) 0.5um ~ 20.0um NA Greater than 90% accuracy of 10,000 particles/ml
Smartscope OGP inc. 250CFOX X : 300mm 0.0001 X,Y : E2=(3.0+L/75)(µm)
Y : 150mm Z : E1=(5.0+L/150)(µm)
Z : 150mm –
Coating Thickness Gauge Fischer DUALSCOPE MP0 11.7 ~ 995.5 µm 0.01 / 0.1 µm ±0.3 µm
 
Equipment Maker Model Capacity (Range) Resolution / Step Accuracy (MU)
CMM Mitutoyo BEYOND CRYSTA C544 X : 500mm 0.0001mm MPE.E=(1.9+3L/1000)/ (1.7+3L/1000)(µm)
Y : 400mm MPE.P=1.9/1.7(µm)
Z : 400mm
CMM Acccretech (Tokyo Seimitsu) XYZAX AXCEL X : 900mm 0.0002mm MPE E0 (µm) = 1.8 + 4L/1000
Y : 1000mm (L in mm)
Z : 600mm
Profile Projector Mitutoyo PV-500 X : 200mm 0.001mm X,Y : (3 + L/10) µm
Y : 100mm
Surface Roughness Tester Mitutoyo SV-402 X-Axis : 50mm Z1 (Detector) : 0.1/0.01/0.001um NA
Z1 (Detector) : 600/80/8um
Roundtest Mitutoyo RA-2000 X : 175mm 0.0001mm NA
Y : 280mm
Tool Measuring Microscopes Mitutoyo MF-1020T X : 200mm 0.001mm (µm)
Y : 100mm 3+0.02L
Hardness Tester Mitutoyo HR-511 810-208E 15, 30, 45, 60, 100, 150 kgf 0.1RCK NA
0.1SRCK
Hardness Tester Mitutoyo HM-113 810-969E 10 ~ 1000 gf 0.1HV NA
Contour Measuring Instrument Acccretech (Tokyo Seimitsu) Surfcom Nex 030 DX Z-axis (mm): 60mm 0.1 µm X : ±(1.0 +1L/100) µm
Z : ±(1.5 + 2H/100) µm
Countourecord Acccretech (Tokyo Seimitsu) Surfcom 1700DX Z : 50mm 0.1 µm X : ± (1.0+1L/100)
X : 100mm Z : ± (1.8+|2H|/100)
Roughness Tester Acccretech (Tokyo Seimitsu) Surfcom 1400D X : 100mm/0.1μm or 32,000 points 0.001 ±5 %
CNC Video Measuring System NEXIV Nikon iNEXIV VMA-6555 X : 650mm 0.0001 X : ±0.40um
Y : 550mm Y : ±0.50um
Z : 200mm Z : ±1.0um
Profile Projector Nikon V-24B X : 200mm 0.001 0.004 mm
Y : 80mm
Profile Projector Nikon V-20B X : 150mm 0.001 0.004 mm
Y : 100mm
Tool Measuring Microscopes Nikon MM-40 X : 120mm 0.001mm 0.007 mm
Y : 80mm
IM-Vision Keyence IM-6120 Z : 30mm NA NA
X : 100mm Y :200mm
JISC Loadcell JISC JLC-M1kN 0-1000/0.1N 1000 ±0.50 %
Liquid Particle Spectrometer PMS CLS700(T)/Liquilazs05 (0.5 micron) 0.5um ~ 20.0um NA NA
Smartscope OGP inc. 250CFOX X : 300mm 0.0001 X,Y : E2=(3.0+L/75)(µm)
Y : 150mm Z : E1=(5.0+L/150)(µm)
Z : 150mm
Coating Thickness Gauge Fischer DUALSCOPE MP0 11.7 ~ 995.5 µm 0.01 / 0.1 µm ±0.3 µm

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